所属分类：
软件工程
开发工具：MultiPlatform
文件大小：788KB
下载次数：10
上传日期：2008-10-17 18:18:04
说明： Testability is the concern most often voiced by Texas Instruments (TIä )
application specific integrated circuit (ASIC) users. This document is intended
to consolidate TI policies into a coherent approach to designing for testability.
It is not intended as a specification, but as a guide you can use for developing
test strategies when designs are being initiated
文件列表：
design_for_test.pdf
